Scanning Acoustic Microscope (SAM)

Scanning Acoustic Microscope (SAM)

Description

The Scanning Acoustic Microscope (SAM) Insight IS-202 is an inspection system for non-destructive analysis and failure detection in microelectronic devices, materials and surface interfaces.

Capacities

  • Automatic PC controlled
  • Active scanning area: 200 mm x 150 mm x 50 mm
  • Transmission and reflection mode
  • Moving speed: minimum 10 mm/s
  • Accuracy and repeatability for X, Y, Z: better than 0.01 mm
  • System equipped with set of transducers: low and medium frequency (10 and 35 MHz), and high and ultra-high frequency (75 and 110 MHz)

Applications

The Scanning Acoustic Microscope Insight IS-202 is a PC controlled inspection system for non-destructive analysis and failure detection in fields:

  • Microelectronic, semiconductor devices, microsystems and MEMS (CSP and Flip Chip underfill, void and delamination analysis, integrity evaluation, internal defect detection)
  • Materials science, including heterogeneous and composite materials and systems (inclusion, crack and void detection in metals, plastics, resin, void evaluation)
  • Interface analysis (delamination of composite materials, interface analysis on heterogeneous assemblies).
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Last update on July 20, 2015