Probe station

Probe station

Description

The Probe station is devoted to access fine electrical contacts to measure electrical signals from an IC, MEMS, microsystems, electronic components and etc. for electrical characterization.

Capacities

  • Up to 6 probes measurement
  • Probe tips: tungsten, straight, 25 micron
  • Manual positioner:
    • Resolution: 5 μm
    • Travel range (X / Y / Z): 8 mm / 6 mm / 25 mm
    • Screw resolution (X / Y / Z): 350 μm / 500 μm / 1000 μm
    • Mounting vacuum, magnetic
  • Electrical connection guarded
  • Optical microscope.

Applications

The probe station can be use to power an IC or a circuit to check the signal outputs. This tool also allows to characterize tiny components such as a resistor, capacitor, inductor, diode etc. The measurement can be done using up to 6 points measurement.

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Last update on December 29, 2015