Probe station

Description

The Probe station is devoted to access fine electrical contacts to measure electrical signals from an IC, MEMS, microsystems, electronic components and etc. for electrical characterization.

Capacities

Up to 6 probes measurement
Probe tips: tungsten, straight, 25 micron
Manual positioner:
- Resolution: 5 μm
- Travel range (X / Y / Z): 8 mm / 6 mm / 25 mm
- Screw resolution (X / Y / Z): 350 μm / 500 μm / 1000 μm
- Mounting vacuum, magnetic
Electrical connection guarded
Optical microscope.

Applications

The probe station can be use to power an IC or a circuit to check the signal outputs. This tool also allows to characterize tiny components such as a resistor, capacitor, inductor, diode etc. The measurement can be done using up to 6 points measurement.