Probe station
Description
The Probe station is devoted to access fine electrical contacts to measure electrical signals from an IC, MEMS, microsystems, electronic components and etc. for electrical characterization.
Capacities
- Up to 6 probes measurement
- Probe tips: tungsten, straight, 25 micron
- Manual positioner:
- Resolution: 5 μm
- Travel range (X / Y / Z): 8 mm / 6 mm / 25 mm
- Screw resolution (X / Y / Z): 350 μm / 500 μm / 1000 μm
- Mounting vacuum, magnetic
- Electrical connection guarded
- Optical microscope.
Applications
The probe station can be use to power an IC or a circuit to check the signal outputs. This tool also allows to characterize tiny components such as a resistor, capacitor, inductor, diode etc. The measurement can be done using up to 6 points measurement.